Oct. 23, 2009
Topcon establishes new R&D company for 3D Inspection Technology in Canada(News Release)

Sep. 4, 2009
NEDO announces its subsidized business in fiscal year 2009.

May 21, 2009
Wafer Surface Analyzer, Chip Defect Inspection System, updated.

Jun. 27, - Jul. 02, 2010
iib2010 (Mie, Japan) (Open in another window)

Jul. 28-30, 2010
Micromachine/MEMS 2010 (Tokyo, Japan) (Open in another window)