Finetech

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News archives (Finetech)
Oct. 23, 2009 Topcon establishes new R&D company for 3D Inspection Technology in Canada(News Release)
Sep. 4, 2009 NEDO announces its subsidized business in fiscal year 2009. (topics)
May 21, 2009 Wafer Surface Analyzer, Chip Defect Inspection System updated.

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